VectorStar ME7838系列寬帶系統(tǒng)提供了高性能緊湊的毫米波模塊,具有業(yè)界的校準穩(wěn)定性。其他寬帶系統(tǒng)仍然使用在關鍵頻段上原始方向性性能較差的技術，而ME7838系列是在所有頻段都具有較好方向性的的寬帶系統(tǒng)。其結果是更好的校準穩(wěn)定性和更好的測量穩(wěn)定性，意味著需要二次校準的間隔時間較長，可以進行精確的測量和提高生產效率。

新的ME7838D同外加的安立MA25300A毫米波模塊一齊將高性能寬帶測量系統(tǒng)性能提升到一個新的水平。該MA25300A模塊增加了一個波導頻段，并結合了安立開發(fā)的0.8毫米同軸連接器，提供了一臺單次掃描操作超出了W波段限制的寬帶矢量網絡分析儀。

所有的VectorStar ME7838寬帶系統(tǒng)都包含一個RF VNA架構，使用電橋取代了耦合器，從而擴展了頻率下限到RF頻段（可操作到40KHz），用于近直流分析，具有優(yōu)異的動態(tài)范圍。

AWR Connected™ to Anritsu VectorStar
Anritsu's VectorStar Vector Network Analyzer (VNA) uniquely combines design and measurement by including AWR's Microwave Office® design software as a standard feature within the instrument, as a separate application on your desktop.

You now have access to all of the design tools essential for high-frequency IC, PCB, and module design at your fingertips, right on your VNA, including:

The integration of high-frequency design tools within high-performance VNAs is the way of the future - but it's available today, only from Anritsu and AWR.

The VectorStar ME7838 Series broadbａnd VNA offers the widest available single frequency sweep from 70 kHz to 110, (ME7838AX to 125), (ME7838EX to 125), to 145 GHz, and to 220 GHz with mmWave bands to 1.1 THz.

The following are various published works that have utilized the VectorStar vector network analyzer to conduct their measurements. These papers are the property of their authors who have given Anritsu permission to post these.

Extraordinary Permittivity Characterization of 4H SiC at Millimeter-wave Frequencies
Lei Li, Mohammad Javad Asadi, School of Electrical and Computer Engineering, Cornell University Steve Reyes, Anritsu Company Patrick Fay, Department of Electrical Engineering, The University of Notre Dame James C. M. Hwang, School of Electrical and Computer Engineering, Cornell University And Department of Materials Science and Engineering, Cornell University. 22 June 2023

Calibration, Repeatability and Related Characteristics of On-wafer, Broadbａnd 70kHz-220 GHz Single-Sweep Measurements
Andrej Rumiantsev, MPI Corporation Jon Martens, Steve Reyes, Anritsu Company. 02 Nov 2020

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature
Muller, Anrei A. et al; ACS Applied Electronic Materials. 16 Apr 2020

A novel reconfigurable CMOS compatible Ka bａnd bandstop structure using split-ring resonators and Vadandium Dioxide (VO2) phase change switches
Muller, Anrei A. et al; Infoscience EPFL scientific publications. 22 Aug 2019

3D Smith charts scattering parameters frequency-dependent orientation analysis and complex-scalar multi-parameter characterization applied to Peano reconfigurable vanadium dioxide inductors
Mueller, Andrei A. et al; Scientific Reports. 04 Dec 2019

Anritsu has partnered with the following industry-leading companies to provide a variety of proven material measurement capabilities that are compatible with the VectorStar and ShockLine vector network analyzer families.

Material Measurements

	Compass Technology Choose from off-the-shelf or custom-designed RF material measurement systems able to measure material properties from 100 MHz to 90 GHz. These solutions include: focused beam, resonant cavity, waveguides, spot probes, free space measurement systems, and more. Anritsu and Compass Technology Group Material Measurements Solutions Compass Technology Group VectorStar Integration [video]
	Keycom Technologies Select from a variety of material measurement solutions that leverage various methods including: resonator, frequency change, probe type, co-axial tube and waveguide type S-parameter, free space, capacitance, epsilometery, and more. Anritsu and Keycom Material Measurement Solution
	SWISSto12 Providing hardware and software technology capable of measuring: solid samples; soft sample and foam; liquid samples and powder; thin films; dielectric coatings and multilayer materials; alumina plate; and more. Anritsu and SWISSto12 Material Measurement Solution